Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging Analysis Download Free (EPUB, PDF)
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.
Hardcover: 616 pages
Publisher: Imperial College Press (October 21, 2014)
Language: English
ISBN-10: 184816789X
ISBN-13: 978-1848167896
Product Dimensions: 1.2 x 6.2 x 9 inches
Shipping Weight: 3.4 pounds (View shipping rates and policies)
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