Scanning Transmission Electron Microscopy: Imaging And Analysis Download Free (EPUB, PDF)
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Hardcover: 762 pages
Publisher: Springer; 2011 edition (March 22, 2011)
Language: English
ISBN-10: 1441971998
ISBN-13: 978-1441971999
Product Dimensions: 7 x 1.6 x 10 inches
Shipping Weight: 3.8 pounds (View shipping rates and policies)
Average Customer Review: 5.0 out of 5 stars See all reviews (1 customer review)
Best Sellers Rank: #2,182,725 in Books (See Top 100 in Books) #72 in Books > Science & Math > Experiments, Instruments & Measurement > Electron Microscopes & Microscopy #232 in Books > Engineering & Transportation > Engineering > Materials & Material Science > Testing #835 in Books > Science & Math > Physics > Solid-State Physics
I own a dozen TEM books, and I must say this is the most comprehensive STEM book that I have. The book reviews the history of STEM first, and then goes over basics of STEM imaging, the Ronchigram, simulation/image interpretation, EELS and EDS. The book also covers various applications of STEM and Cs-corrected STEM to materials characterization with plenty of newest data. Leading microscopists contributed to the book. I wish that the book had a chapter on principles of Cs correction. ..the book discusses very little about Cs correction.
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